In-Flight Anomalies and Radiation Performance of NASA Missions - Selected Lessons Learned

This presentation addresses in-flight electronic disturbances and radiation, specifically anomaly resolution. The process for anomaly review takes into account the environment, selected parts and design, existing and/or new radiation test data, risk probability and actions to be taken. Noise spikes and the meaning of upset in a fiber optic link are also discussed

A Year in the Life of the NASA Electronic Parts and Packaging (NEPP) Program

NEPP Mission Statement: Provide NASAs leadership for developing and maintaining guidance for the screening, qualification, test, and reliable usage of electrical, electronic, and electromechanical (EEE) parts by NASA, in collaboration with other government Agencies and industry

Challenges for Electronics in the Vision for Space Exploration

This presentation has been a brief snapshot discussing electronics and Exploration-related challenges. The vision for Space Exploration creates a new paradigm for NASA missions. This includes transport (Crew Exploration Vehicle-CEV), and lunar and Mars Exploration and human presence. If one considers the additional hazards faced by these concepts versus more traditional NASA missions, multiple challenges surface for reliable utilization of electronic parts. The true challenge is to provide a risk as low as reasonably achievable (ALARA-a traditional biological radiation exposure term), while still providing cost effective solutions. This presentation also discusses the hazard for electronic parts and exploration, the types of electronic parts for exploration, and the critical juncture for space usage of commercial changes in the electronics world

The View from 10,000 Feet - What is Happening and What it Means for Flight Electronics

No abstract availabl

The NASA Electronic Parts and Packaging (NEPP) Program: Results and Direction

The NASA Electronic Parts and Packaging (NEPP) Program's mission is to provide guidance to NASA for the selection and application of microelectronic technologies, to improve understanding of the risks related to the use of these technologies in the space environment and to ensure that appropriate research is performed to meet NASA mission assurance needs. This viewgraph presentation reviews the NEPP program's goals and objectives, and reviews many of the missions that the NEPP program has impacted, both in and out of NASA. Also included are examples of the evaluation that the program performed

The NASA Electronic Parts and Packaging (NEPP) Program: Memory and Advanced Processor Plans

No abstract availabl

Memory Overview - Technologies and Needs

As NASA has evolved it's usage of spaceflight computing, memory applications have followed as well. In this talk, we will discuss the history of NASA's memories from magnetic core and tape recorders to current semiconductor approaches. We will briefly describe current functional memory usage in NASA space systems followed by a description of potential radiation-induced failure modes along with considerations for reliable system design

Radiation Effects on Emerging Technologies: Implications of Space Weather Risk Management

As NASA and its space partners endeavor to develop a network of satellites capable of supporting humankind's needs for advanced space weather prediction and understanding, one of the key challenges is to design a space system to operate in the natural space radiation environment In this paper, we present a description of the natural space radiation environment, the effects of interest to electronic or photonic systems, and a sample of emerging technologies and their specific issues. We conclude with a discussion of operations in the space radiation hazard and considerations for risk management

A Technical and Cost Perspective on Radiation Testing Challenges

A viewgraph presentation detailing costs and technical perspectives on radiation testing is shown. The topics include: 1) Introduction - a Changing Microelectronics World; 2) Sample Technology Changes and Related Impacts on Radiation Testing; 3) Perspective on the "New" Cost or Doing Business; and 4) Considerations

Proton Particle Test Fluence: What's the Right Number?

While we have been utilizing standard fluence levels such as those listed in the JESD57 document, we have begun revisiting what an appropriate test fluence is when it comes to qualifying a device for single events. Instead of a fixed fluence level or until a specific number of events occurs, a different thought process is required